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Irradiation
test of Staystik thermoplastic adhesive film type 571
M.Moll, C.Joram, I.McGill
Characterization of the film as given by the producer
Alpha-Fry Technologies
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Die Shear Adhesion @ 25C: |
> 2000 psi
> 13790 kPa (Pa = kg/(ms2)
= N/m2)
> 13.8 N/mm2
> 414 N/die
with a die of 5x6mm2 |
Preparation of samples
(6 June 2002):
Support:
Ceramic sample holders (5x5cm² ) with thin square
shaped gold layer in middle (2x2cm² ).
Samples to be glued:
For shear test: Microelectronic chips
(OPAL-experiment) of 6x5mm²
For conductivity test:- Pieces of Aluminum foil of
6x5mm²
Gluing:
The
ceramic sample holder was placed on a hot plate of a die bonder (170°C) and
6x5mm² pieces of the Staystik-film were placed on the hot ceramic sample holder.
Afterwards the chips
and the pieces of aluminum foil were placed with a die bonder on the hot
staystik film.
Figure of the sample:
5 such samples were produced
Irradiation of samples
(6 - 12 June 2002)
4 samples were irradiated with 24 GeV/c protons at
the CERN irradiation facility
IRRAD1.
Great care was taken
to measure the irradiation fluence for each individual chip and aluminium.
| Sample |
Chip, left,up |
Chip,right,up |
Chip,right,down |
Al,left,down |
| Sample 01 |
non |
non |
non |
non |
| Sample 02 |
(531) |
(532) |
(533) |
(534) |
| Sample 03 |
2.5e14(535) |
(536) |
3.3e14(537) |
(538) |
| Sample 05 |
(539) |
(540) |
3.6e14(541) |
3.9e14(542) |
| Sample 04 |
1.2e15(543) |
1.2e15(544) |
1.7e15(545) |
1.4e15(546) |
Table: 24GeV/c
proton fluence [p/cm2] and in brackets the label of the according dosimeter.
Details about the
dosimetry including measurement errors for the individual dosimeters can be
found
here.
Conductivity test
The resistivity was measured with a Keithley 2410 between the Gold -layer
and the Aluminium foil.
| Sample |
Fluence |
Resistivity [ohm] |
| Sample 01 |
non |
1.6 ? 0.2 |
| Sample 02 |
|
1.2 ? 0.2 |
| Sample 03 |
3e14 |
2.4 ? 0.2 |
| Sample 05 |
3.9e14(542) |
2.3 ? 0.2 |
| Sample 04 |
1.4e15(546) |
1.4 ? 0.2 |
Shear test
Conclusion:
Also no quantitative values can be given for a shear
test, the performed experiment demonstrated that the adhesive film is still
holding electronic chips sufficiently strong after an irradiation with 24 GeV/c
protons of up to 1.7e15 p/cm2. The chips were strongly attached to the film and
could not easily be removed by hand. Within the resolution of the conductivity
measurement no change of the resistivity of the film was observed (<1W for a
6x5mm2 piece).
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